ERA provides analysis using a range of powerful techniques to provide the maximum benefit to its clients:

Scanning electron microscopy (SEM): ideal for examination of very small samples and small things in samples, photographing items with high depth of field, analysis of the elemental composition of materials including RoHS analysis. Includes both energy dispersive (ED) and ultra sensitive wavelength dispersive (WD) x-ray analysis and automated particle detection.

Energy dispersive x-ray fluorescence (ED-XRF): for RoHS screening and useful for measurement of coating thickness and composition (e.g. in electrical contacts).

Ion chromatography (IC): provides information on the ionic composition of materials. Ideal for diagnosing contamination problems (e.g. PCB flux residues, coating adhesion problems etc.).

Fourier-transform infrared spectroscopy (FT-IR): used to identify polymeric materials such as brominated flame retardants and for investigation of surface contamination issues.

UV/visible spectroscopy: measurement of film thickness, transmission, absorption etc.

Thermal analysis - differential scanning calorimetry (DSC), thermogravimetric analysis (TGA), thermomechanical analysis (TMA): useful for characterisation of melting and boiling point, loss of volatile phases, characterisation of polymers, etc. TGA can be used with FT-IR to identify phases.

We also has access at ERA and with external service providers to other techniques including microfocus x-ray, GC-MS, ICP, AAS, tensile and shear testing and more.